Design of an efficient fully nonvolatile and radiation-hardened majority-based magnetic full adder using FinFET/MTJ. - Sina Bakhtavari Mamaghani; Mohammad Hossein Moaiyeri; Ghassem Jaberipur (Microelectron. J., 2020)

Smart Hammering: A practical method of pinhole detection in MRAM memories. - Sina Bakhtavari Mamaghani; Christopher Münch; Jongsin Yun; Martin Keim; Mehdi Baradaran Tahoori (DATE, 2023)

A Dynamic Testing Scheme for Resistive-Based Computation-In-Memory Architectures. - Sina Bakhtavari Mamaghani; Priyanjana Pal; Mehdi Baradaran Tahoori (ASPDAC, 2024)

Analog Printed Spiking Neuromorphic Circuit. - Priyanjana Pal; Haibin Zhao; Maha Shatta; Michael Hefenbrock; Sina Bakhtavari Mamaghani; Sani R. Nassif; Michael Beigl; Mehdi B. Tahoori (DATE, 2024)

MBIST-based weak bit screening method for embedded MRAM. - Jongsin Yun; Sina Bakhtavari Mamaghani; Mehdi B. Tahoori; Christopher Münch; Martin Keim (ETS, 2024)

MBIST-based MRAM defect screening for safety-critical applications. - Sina Bakhtavari Mamaghani; Jongsin Yun; Martin Keim; Mehdi B. Tahoori (ITC, 2024)

Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM. - Sina Bakhtavari Mamaghani; Jongsin Yun; Martin Keim; Mehdi B. Tahoori (VTS, 2024)

MBIST-guided Reliability Improvement Scheme for SRAM-based Computation in Memory. - Sina Bakhtavari Mamaghani; Jongsin Yun; Martin Keim; Mehdi Baradaran Tahoori (ETS, 2025)