Wafer-level adaptive trim seed forecasting based on E-tests. - Constantinos Xanthopoulos; Ali Ahmadi; Sirish Boddikurapati; Amit Nahar; Bob Orr; Yiorgos Makris (ISCAS, 2017)

Wafer-Level Adaptive Vmin Calibration Seed Forecasting. - Constantinos Xanthopoulos; Deepika Neethirajan; Sirish Boddikurapati; Amit Nahar; Yiorgos Makris (DATE, 2019)