Parameter-importance based Monte-Carlo Technique for Variation-aware Analog Yield Optimization. - Sita Kondamadugula; Srinath R. Naidu (ACM Great Lakes Symposium on VLSI, 2016)

Accelerated evolutionary algorithms with parameterimportance based population initialization for variation-aware analog yield optimization. - Sita Kondamadugula; Srinath R. Naidu (MWSCAS, 2016)