Testability, Debuggability, and Manufacturability Features of the UltraSPARCTM-I Microprocessor. - Marc E. Levitt; Srinivas Nori; Sridhar Narayanan; G. P. Grewal; Lynn Youngs; Anjali Jones; Greg Billus; Siva Paramanandam (ITC, 1995)

Mapping and Repairing Embedded-Memory Defects. - Lynn Youngs; Siva Paramanandam (IEEE Des. Test Comput., 1997)