Non-Conventional Faults in BiCMOS Digital Circuits. - Siyad C. Ma; Edward J. McCluskey (ITC, 1992)

An Experimental Chip to Evaluate Test Techniques: Experiment Results. - Siyad C. Ma; Piero Franco; Edward J. McCluskey (ITC, 1995)

Open faults in BiCMOS gates. - Siyad C. Ma; Edward J. McCluskey (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995)

Analysis and Detection of Timing Failures in an Experimental Test Chip. - Piero Franco; Siyad C. Ma; Jonathan Chang; Yi-Chin Chu; Sanjay Wattal; Edward J. McCluskey; Robert L. Stokes; William D. Farwell (ITC, 1996)

Testability Features of AMD-K6TM Microprocessor. - R. Scott Fetherston; Imtiaz P. Shaik; Siyad C. Ma (ITC, 1997)

Testability Features of the AMD-K6 Microprocessor. - R. Scott Fetherston; Imtiaz P. Shaik; Siyad C. Ma (IEEE Des. Test Comput., 1998)

A comparison of bridging fault simulation methods. - R. Scott Fetherston; Imtiaz P. Shaik; Siyad C. Ma (ITC, 1999)