Circular Self-Test Path: A Low-Cost BIST Technique. - Andrzej Krasniewski; Slawomir Pilarski (DAC, 1987)

Circular self-test path: a low-cost BIST technique for VLSI circuits. - Andrzej Krasniewski; Slawomir Pilarski (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1989)

A Novel Checkpointing Scheme for Distributed Database Systems. - Slawomir Pilarski; Tiko Kameda (PODS, 1990)

High Quality Testing of Embedded RAMs Using Circular Self-Test Path. - Andrzej Krasniewski; Slawomir Pilarski (ITC, 1992)

Built-in self-test design for large embedded PLAs. - Alicja Pierzynska; Slawomir Pilarski (VTS, 1992)

Counter-based compaction: An analysis for BIST. - Slawomir Pilarski; Kevin James Wiebe (J. Electron. Test., 1992)

Performance of signature analysis: a survey of bounds, exact, and heuristic algorithms. - André Ivanov; Slawomir Pilarski (Integr., 1992)

Estimating testing effectiveness of the circular self-test path technique. - Slawomir Pilarski; Andrzej Krasniewski; Tiko Kameda (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

Checkpointing for Distributed Databases: Starting from the Basics. - Slawomir Pilarski; Tiko Kameda (IEEE Trans. Parallel Distributed Syst., 1992)

BIST and Delay Fault Detection. - Slawomir Pilarski; Alicja Pierzynska (ITC, 1993)

Simple Bounds on the Convergence Rate of an Ergodic Markov Chain. - Slawomir Pilarski; Tiko Kameda (Inf. Process. Lett., 1993)

Notes on Multiple Input Signature Analysis. - Tiko Kameda; Slawomir Pilarski; André Ivanov (IEEE Trans. Computers, 1993)

Sequential faults and aliasing. - Slawomir Pilarski; Tiko Kameda; André Ivanov (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993)

On minimizing aliasing in scan-based compaction. - Slawomir Pilarski; André Ivanov; Tiko Kameda (J. Electron. Test., 1994)

Quality considerations in delay fault testing. - Alicja Pierzynska; Slawomir Pilarski (EURO-DAC, 1995)

Non-Robust versus Robust. - Alicja Pierzynska; Slawomir Pilarski (ITC, 1995)

Comments on "Aliasing Properties of Circular MISRs". - Slawomir Pilarski (J. Electron. Test., 1995)

Counter-Based Compaction: Delay and Stuck-Open Faults. - Slawomir Pilarski; Kevin James Wiebe (IEEE Trans. Computers, 1995)

Comments on "Test efficiency analysis of random self-test of sequential circuits". - Slawomir Pilarski (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995)

Delay Fault Testing: How Robust are Our Models? - Sandeep K. Gupta 001; Slawomir Pilarski; Sudhakar M. Reddy; Jacob Savir; Prab Varma (VTS, 1996)

Pitfalls in delay fault testing. - Alicja Pierzynska; Slawomir Pilarski (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997)

SAT with partial clauses and back-leaps. - Slawomir Pilarski; Gracia Hu (DAC, 2002)

Speeding up SAT for EDA. - Slawomir Pilarski; Gracia Hu (DATE, 2002)

Efficient equivalence checking with partitions and hierarchical cut-points. - Demos Anastasakis; Lisa McIlwain; Slawomir Pilarski (DAC, 2004)

Optimal Policy for Bernoulli Bandits: Computation and Algorithm Gauge. - Sebastian Pilarski; Slawomir Pilarski; Dániel Varró (IEEE Trans. Artif. Intell., 2021)

Delayed Reward Bernoulli Bandits: Optimal Policy and Predictive Meta-Algorithm PARDI. - Sebastian Pilarski; Slawomir Pilarski; Dániel Varró (IEEE Trans. Artif. Intell., 2022)