Designing and Implementing Efficient BISR Techniques for Embedded RAMs. - Michael Nicolaidis; Slimane Boutobza; Nadir Achouri; R. D. Shawn Blanton; Julie Segal; David Y. Lepejian; Ben Chu; Tony Singh; Harvey Berman (LATW, 2001)

Optimal Reconfiguration Functions for Column or Data-bit Built-In Self-Repair. - Michael Nicolaidis; Nadir Achouri; Slimane Boutobza (DATE, 2003)

Dynamic Data-bit Memory Built-In Self- Repair. - Michael Nicolaidis; Nadir Achouri; Slimane Boutobza (ICCAD, 2003)

Programmable memory BIST. - Slimane Boutobza; Michael Nicolaidis; Kheiredine M. Lamara; Andrea Costa (ITC, 2005)

A Transparent based Programmable Memory BIST. - Slimane Boutobza; Michael Nicolaidis; Kheiredine M. Lamara; Andrea Costa (ETS, 2006)

A Journey from STIL to Verilog. - Slimane Boutobza; Sorin Popa; Andrea Costa (EWDTS, 2018)

An Automatic Testbench Generator for Test Patterns Validation. - Slimane Boutobza; Sorin Popa; Andrea Costa (EWDTS, 2018)

Unified STIL Flow: A Test Pattern Validation Approach for Compressed Scan Designs. - Slimane Boutobza; Andrea Costa; Sorin Popa (EWDTS, 2019)

Effective and Efficient Test and Diagnosis Pattern Generation for Many Inter-Die Interconnects in Chiplet-Based Packages. - Po-Yao Chuang; Francesco Lorenzelli; Sreejit Chakravarty; Slimane Boutobza; Cheng-Wen Wu; Georges G. E. Gielen; Erik Jan Marinissen (3DIC, 2023)