Faults in Processor Control Subsystems: Testing Correctness and Performance Faults in the Data Prefetching Unit. - Sobeeh Almukhaizim; Peter Petrov; Alex Orailoglu (Asian Test Symposium, 2001)

Low-cost, software-based self-test methodologies for performance faults in processor control subsystems. - Sobeeh Almukhaizim; Peter Petrov; Alex Orailoglu (CICC, 2001)

Fault Tolerant Design of Combinational and Sequential Logic Based on a Parity Check Code. - Sobeeh Almukhaizim; Yiorgos Makris (DFT, 2003)

Cost-Effective Graceful Degradation in Speculative Processor Subsystems: The Branch Prediction Case. - Sobeeh Almukhaizim; Thomas Verdel; Yiorgos Makris (ICCD, 2003)

On Compaction-Based Concurrent Error Detection. - Sobeeh Almukhaizim; Petros Drineas; Yiorgos Makris (IOLTS, 2003)

On Concurrent Error Detection with Bounded Latency in FSMs. - Sobeeh Almukhaizim; Petros Drineas; Yiorgos Makris (DATE, 2004)

Compiler-Based Frame Formation for Static Optimization. - Feng Shi 010; Sobeeh Almukhaizim; Pey-Chang Lin; Yiorgos Makris (ICCD, 2004)

Concurrent Error Detection for Combinational and Sequential Logic via Output Compaction. - Sobeeh Almukhaizim; Petros Drineas; Yiorgos Makris (ISQED, 2004)

Cost-Driven Selection of Parity Trees. - Sobeeh Almukhaizim; Petros Drineas; Yiorgos Makris (VTS, 2004)

Concurrent Error Detection in Asynchronous Burst-Mode Controllers. - Sobeeh Almukhaizim; Yiorgos Makris (DATE, 2005)

Compaction-based concurrent error detection for digital circuits. - Sobeeh Almukhaizim; Petros Drineas; Yiorgos Makris (Microelectron. J., 2005)

Berger code-based concurrent error detection in asynchronous burst-mode machines. - Sobeeh Almukhaizim; Yiorgos Makris (DATE, 2006)

Seamless Integration of SER in Rewiring-Based Design Space Exploration. - Sobeeh Almukhaizim; Yiorgos Makris; Yu-Shen Yang; Andreas G. Veneris (ITC, 2006)

Entropy-driven parity-tree selection for low-overhead concurrent error detection in finite state machines. - Sobeeh Almukhaizim; Petros Drineas; Yiorgos Makris (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006)

Concurrent Error Detection Methods for Asynchronous Burst-Mode Machines. - Sobeeh Almukhaizim; Yiorgos Makris (IEEE Trans. Computers, 2007)

Coping with Soft Errors in Asynchronous Burst-Mode Machines. - Sobeeh Almukhaizim; Feng Shi 010; Yiorgos Makris (ASYNC, 2008)

On the Minimization of Potential Transient Errors and SER in Logic Circuits Using SPFD. - Sobeeh Almukhaizim; Yiorgos Makris; Yu-Shen Yang; Andreas G. Veneris (IOLTS, 2008)

Peak Power Reduction Through Dynamic Partitioning of Scan Chains. - Sobeeh Almukhaizim; Ozgur Sinanoglu (ITC, 2008)

Soft Error Mitigation Through Selective Addition of Functionally Redundant Wires. - Sobeeh Almukhaizim; Yiorgos Makris (IEEE Trans. Reliab., 2008)

X-alignment techniques for improving the observability of response compactors. - Ozgur Sinanoglu; Sobeeh Almukhaizim (ITC, 2009)

Dynamic Scan Chain Partitioning for Reducing Peak Shift Power During Test. - Sobeeh Almukhaizim; Ozgur Sinanoglu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

Soft-Error Tolerance and Mitigation in Asynchronous Burst-Mode Circuits. - Sobeeh Almukhaizim; Feng Shi 010; Eric Love; Yiorgos Makris (IEEE Trans. Very Large Scale Integr. Syst., 2009)

X-Align: Improving the Scan Cell Observability of Response Compactors. - Ozgur Sinanoglu; Sobeeh Almukhaizim (IEEE Trans. Very Large Scale Integr. Syst., 2009)

Test power reduction in compression-based reconfigurable scan architectures. - Sobeeh Almukhaizim; Mohammad Gh. Mohammad; Mohammad Khajah (ETS, 2010)

Reconfigurable low-power Concurrent Error Detection in logic circuits. - Sobeeh Almukhaizim; Sara Bunian; Ozgur Sinanoglu (IDT, 2010)

Cost-free low-power test in compression-based reconfigurable scan designs. - Sobeeh Almukhaizim; Mohammad Gh. Mohammad; Eman AlQuraishi (IDT, 2010)

Identification of IR-drop hot-spots in defective power distribution network using TDF ATPG. - Junxia Ma; Mohammad Tehranipoor; Ozgur Sinanoglu; Sobeeh Almukhaizim (IDT, 2010)

Predictive analysis for projecting test compression levels. - Ozgur Sinanoglu; Sobeeh Almukhaizim (ITC, 2010)

Low-power test in compression-based reconfigurable scan architectures. - Sobeeh Almukhaizim; Mohammad Gh. Mohammad; Mohammad Khajah (SBCCI, 2010)

On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift Power. - Sobeeh Almukhaizim; Shouq Alsubaihi; Ozgur Sinanoglu (J. Electron. Test., 2010)

Error-resilient design of branch predictors for effective yield improvement. - Sobeeh Almukhaizim; Ozgur Sinanoglu (LATW, 2011)

Analysis of the soft error susceptibility and failure rate in logic circuits. - Eman AlQuraishi; May Al-Roomi; Sobeeh Almukhaizim (Int. Arab J. Inf. Technol., 2011)

Novel hazard-free majority voter for n-modular redundancy-based fault tolerance in asynchronous circuits. - Sobeeh Almukhaizim; Ozgur Sinanoglu (IET Comput. Digit. Tech., 2011)

Test Power Reduction via Deterministic Alignment of Stimulus and Response Bits. - Sobeeh Almukhaizim; Eman AlQuraishi; Ozgur Sinanoglu (J. Low Power Electron., 2011)

Unified 2-D X-Alignment for Improving the Observability of Response Compactors. - Ozgur Sinanoglu; Sobeeh Almukhaizim (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011)

Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power Constraints. - Sobeeh Almukhaizim; Sara Bunian; Ozgur Sinanoglu (J. Electron. Test., 2013)

Predictive Techniques for Projecting Test Data Volume Compression. - Samah Mohamed Saeed; Ozgur Sinanoglu; Sobeeh Almukhaizim (IEEE Trans. Very Large Scale Integr. Syst., 2013)