Identifying Faulty TSVs in 3D Stacked IC during Pre-bond Testing. - Surajit Kumar Roy; Sobitri Chatterjee; Chandan Giri (ISED, 2012)

Faulty TSVs identification and recovery in 3D stacked ICs during pre-bond testing. - Surajit Kumar Roy; Sobitri Chatterjee; Chandan Giri; Hafizur Rahaman 001 (3DIC, 2013)