The first observation of p-type electromigration failure in full ruthenium interconnects. - Sofie Beyne; Shibesh Dutta; Olalla Varela Pedreira; Niels Bosman; Christoph Adelmann; Ingrid De Wolf; Zsolt Tökei; Kristof Croes (IRPS, 2018)

Low-Frequency Noise Measurements to Characterize Cu-Electromigration Down to 44nm Metal Pitch. - Sofie Beyne; Olalla Varela Pedreira; Ingrid De Wolf; Zsolt Tökei; Kristof Croes (IRPS, 2019)

Understanding EM-Degradation Mechanisms in Metal Heaters Used for Si Photonics Applications. - Kris Croes; Veerle Simons; Sofie Beyne; Vladimir Cherman; Herman Oprins; Michele Stucchi; Philippe Absil; A. Glabman; Eric Wilcox (IRPS, 2019)