Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids. - Valeriy Sukharev; Armen Kteyan; Farid N. Najm; Yong Hyeon Yi; Chris H. Kim; Jun-Ho Choy; Sofya Torosyan; Yu Zhu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)