Applying Neural Networks to Delay Fault Testing: Test Point Insertion and Random Circuit Training. - Spencer K. Millican; Yang Sun; Soham Roy; Vishwani D. Agrawal (ATS, 2019)

Improved Random Pattern Delay Fault Coverage Using Inversion Test Points. - Soham Roy; Brandon Stiene; Spencer K. Millican; Vishwani D. Agrawal (NATW, 2019)

Machine Intelligence for Efficient Test Pattern Generation. - Soham Roy; Spencer K. Millican; Vishwani D. Agrawal (ITC, 2020)

Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures. - Soham Roy; Brandon Stiene; Spencer K. Millican; Vishwani D. Agrawal (J. Electron. Test., 2020)

Offline hand-drawn circuit component recognition using texture and shape-based features. - Soham Roy; Archan Bhattacharya; Navonil Sarkar; Samir Malakar; Ram Sarkar (Multim. Tools Appl., 2020)

Trident U-Net: An Encoder Fusion for Improved Biomedical Image Segmentation. - Rajdeep Chatterjee; Soham Roy; SK Hafizul Islam (BIOMESIP, 2021)

Unsupervised Learning in Test Generation for Digital Integrated Circuits. - Soham Roy; Spencer K. Millican; Vishwani D. Agrawal (ETS, 2021)

Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator. - Soham Roy; Spencer K. Millican; Vishwani D. Agrawal (VLSID, 2021)

Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits. - Soham Roy; Spencer K. Millican; Vishwani D. Agrawal (VTS, 2021)

A two-stage CNN-based hand-drawn electrical and electronic circuit component recognition system. - Mrityunjoy Dey; Shoif Md Mia; Navonil Sarkar; Archan Bhattacharya; Soham Roy; Samir Malakar; Ram Sarkar (Neural Comput. Appl., 2021)

Improved Localized Sleep Scheduling Techniques to Prolong WSN Lifetime. - Nachiketa Tarasia; Amulya Ratna Swain; Soham Roy; Udit Narayana Kar (Scalable Comput. Pract. Exp., 2021)

Quantum Implementation of ASCON Linear Layer. - Soham Roy; Anubhab Baksi; Anupam Chattopadhyay (IACR Cryptol. ePrint Arch., 2023)

Effectiveness of Timing-Aware Scan Tests in Targeting Marginal Failures and Silent Data Errors in a Data Center Processor. - Suriyaprakash Natarajan; Chaitali S. Oak; Vijay Kakollu; Nipun Chaplot; Soham Roy; Apurva Lonkar; Gerardo J. Perfecto Reyes (ITC, 2024)

Unsupervised Learning Provides Intelligence for Testing Hard to Detect Faults. - Soham Roy; Vishwani D. Agrawal (ITC, 2024)

Quantum Implementation of Linear and Non-Linear Layers. - Anubhab Baksi; Sumanta Chakraborty; Anupam Chattopadhyay; Matthew Chun; SK Hafizul Islam; Kyungbae Jang; Hyunji Kim; Yujin Oh; Soham Roy; Hwajeong Seo; Siyi Wang (SOCC, 2024)

An Amalgamated Testability Measure Derived from Machine Intelligence. - Soham Roy; Vishwani D. Agrawal (VLSID, 2024)

A Survey and Recent Advances: Machine Intelligence in Electronic Testing. - Soham Roy; Spencer K. Millican; Vishwani D. Agrawal (J. Electron. Test., 2024)

Conversational Text Extraction with Large Language Models Using Retrieval-Augmented Systems. - Soham Roy; Mitul Goswami; Nisharg Nargund; Suneeta Mohanty; Prasant Kumar Pattnaik 001 (CoRR, 2025)

Guardians of Generation: Dynamic Inference-Time Copyright Shielding with Adaptive Guidance for AI Image Generation. - Soham Roy; Abhishek Mishra; Shirish Karande 001; Murari Mandal (CoRR, 2025)