Recommend alternative drugs to minimize side-effect using generic name of drug. - Sohee Hwang; Jungrim Kim; Sanghyun Park 003 (EDB, 2016)

CSnet: Constructing symptom network based on disease-symptom relationships. - Sohee Hwang; Jungrim Kim; Jeongwoo Kim; Sanghyun Park (SMC, 2017)

Recommending alternative drugs by using generic drug names to minimise side effects. - Sohee Hwang; Jungrim Kim; Jeongwoo Kim; Sanghyun Park (Int. J. Data Min. Bioinform., 2017)

Reliability of Industrial grade Embedded-STT-MRAM. - Yongsung Ji; Hyunjae Goo; Jungman Lim; Tae-Young Jeong; Taiki Uemura; Gun Rae Kim; Boil Seo; Seungbae Lee; Goeun Park; Jeongmin Jo; Sang-Il Han; Kilho Lee; et al. (IRPS, 2020)

Reliability of STT-MRAM for various embedded applications. - Shinhee Han; Junghyuk Lee; Kiseok Suh; Kyungtae Nam; Daeeun Jeong; Sechung Oh; Sohee Hwang; Yongsung Ji; Kilho Lee; Kangho Lee; Yoonjong Song; Yeongki Hong; et al. (IRPS, 2021)

Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM. - Daehyun Chang; Youngdae Kim; Suksoo Pyo; Shin Hun; Daesop Lee; Sohee Hwang; Jaesik Choi; Siwoong Kim (ITC, 2023)

A 14nm 128Mb Embedded MRAM Macro achieved the Best Figure-Of-Merit with 80MHz Read operation and 18.1Mb/mm² implementation at 0.64V. - Gyuseong Kang; Hyunjin Shin; Hyuntaek Jung; Sunkyu Lee; Jaeseung Choi 001; Sangyeop Baeck; Hyunsung Jung; Daeshik Kim; Sohee Hwang; Shinhee Han; Yongsung Ji; Sei Seung Yoon (VLSI Technology and Circuits, 2023)

A 14nm 128Mb eMRAM Implemented with 17.88Mb/mm2 at 0.60V for Auto-G1 Applications. - Gyuseong Kang; Hyunjin Shin; Sanggyeong Won; Dohui Kim; Kyuseong Kim; Soohoh Seol; Sunkyu Lee; Hangil Lee; Yeonho Jung; Jaechul Shim; Kiseok Suh; Sohee Hwang; et al. (VLSI Technology and Circuits, 2024)

14nm FinFET Node Embedded MRAM Technology for Automotive Non-Volatile RAM Applications with Endurance Over 1E12-Cycles. - Joosung Oh; Jaehyeon Park; Kiseok Suh; Kangmoon Lee; Sohee Hwang; Myeongjun Bak; Honghyun Kim; Baeseong Kwon; DongKyu Lee; Minkwan Kim; Seungmo Noh; Jongmin Lee; et al. (VLSI Technology and Circuits, 2024)