ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure. - Jean-Luc Autran; Daniela Munteanu; Soilihi Moindjie; Tarek Saad Saoud; S. Sauze; Gilles Gasiot; Philippe Roche (Microelectron. Reliab., 2015)

Natural radiation events in CCD imagers at ground level. - Tarek Saad Saoud; Soilihi Moindjie; Daniela Munteanu; Jean-Luc Autran (Microelectron. Reliab., 2016)

Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs. - Soilihi Moindjie; Jean-Luc Autran; Daniela Munteanu; Gilles Gasiot; Philippe Roche (Microelectron. Reliab., 2017)

Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation. - Daniela Munteanu; Jean-Luc Autran; Soilihi Moindjie (Microelectron. Reliab., 2017)