Fast Accurate and Complete ADC Testing. - Solomon Max (ITC, 1989)

Ensuring System Traceability to International Standards. - Solomon Max (ITC, 1994)

Visualizing Quality. - Solomon Max (ITC, 1995)

Extending Calibration Intervals. - Solomon Max (ITC, 1996)

When "almost" is good enough: a fresh look at DSP clock rates. - Eric Rosenfeld; Solomon Max (ITC, 1998)

Testing high speed high accuracy analog to digital converters embedded in systems on a chip. - Solomon Max (ITC, 1999)

Ramp testing of ADC transition levels using finite resolution ramps. - Solomon Max (ITC, 2001)

A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment. - Fengming Zhang; Young-Jun Lee; Thomas Kane; Luca Schiano; Mariam Momenzadeh; Yong-Bin Kim; Fred J. Meyer; Fabrizio Lombardi; Solomon Max; Phil Perkinson (DFT, 2003)

Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment. - Young-Jun Lee; Thomas Kane; Jong-Jin Lim; Young Jun Schiano; Yong-Bin Kim; Fred J. Meyer; Fabrizio Lombardi; Solomon Max (IEEE Trans. Instrum. Meas., 2003)

Measuring the timing jitter of ATE in the frequency domain. - Luca Schiano; Mariam Momenzadeh; Fengming Zhang; Young-Jun Lee; Thomas Kane; Solomon Max; Philip Perkins; Yong-Bin Kim; Fabrizio Lombardi; Fred J. Meyer (IEEE Trans. Instrum. Meas., 2006)

Enhanced ADC sine wave histogram test. - Solomon Max; Richard Liggiero (I2MTC, 2015)