Experimental study of carrier transport in multi-layered structures. - Guoqiao Tao; Cedric Ouvrard; Helene Chauveau; Som Nath (Microelectron. Reliab., 2007)

Fast electromigration wafer mapping for wafer fab process monitoring and improvement. - Yuan Li; Leo van Marwijk; Som Nath (Microelectron. Reliab., 2008)