High Throughput Phenotyping for Various Traits on Soybean Seeds Using Image Analysis. - Jeong-Ho Baek; Eungyeong Lee; Nyunhee Kim; Song Lim Kim; Inchan Choi; Hyeonso Ji; Yong Suk Chung; Man-Soo Choi; Jung-Kyung Moon; Kyung-Hwan Kim (Sensors, 2020)