Device parameter variations of n-MOSFETS with dog-bone layouts in 65nm and 40nm technologies. - Lele Jiang; Song Wen 002; Wei Tai; Wang Lei; Lifu Chang; Yuhua Cheng (ASICON, 2013)

Characteristics of n-MOSFETs with stress effects from neighborhood devices. - Wei Tai; Lele Jiang; Wang Lei; Song Wen 002; Lifu Chang; Yuhua Cheng (ASICON, 2013)