The challenge of signal integrity in deep-submicrometer CMOS technology. - Fabrice Caignet; Sonia Delmas-Bendhia; Etienne Sicard (Proc. IEEE, 2001)

REGINA test mask: research on EMC guidelines for integrated automotive circuits. - C. Lochot; S. Calvet; Sonia Ben Dhia; Etienne Sicard (Microelectron. J., 2004)

Ageing effect on electromagnetic susceptibility of a phase locked loop. - Binhong Li; Alexandre Boyer; Sonia Bendhia; Christophe Lemoine (Microelectron. Reliab., 2010)

Effective Teaching of the Physical Design of Integrated Circuits Using Educational Tools. - Syed Mahfuzul Aziz; Etienne Sicard; Sonia Ben Dhia (IEEE Trans. Educ., 2010)

A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior. - Raúl Fernández-García; Ignacio Gil; Alexandre Boyer; Sonia Bendhia; Bertrand Vrignon (IEICE Trans. Electron., 2011)

Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout. - Néstor Berbel; Raúl Fernández-García; Ignacio Gil; Binhong Li; Alexandre Boyer; Sonia Bendhia (Microelectron. Reliab., 2011)

Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. - Binhong Li; Néstor Berbel; Alexandre Boyer; Sonia Bendhia; Raúl Fernández-García (Microelectron. Reliab., 2011)

Prediction of Long-term Immunity of a Phase-Locked Loop. - Alexandre Boyer; Sonia Ben Dhia; Binhong Li; Christophe Lemoine; Bertrand Vrignon (J. Electron. Test., 2012)

IC Immunity Modeling Process Validation Using On-Chip Measurements. - Sonia Ben Dhia; Alexandre Boyer; Bertrand Vrignon; Mikaël Deobarro (J. Electron. Test., 2012)

On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations. - Sonia Bendhia; Alexandre Boyer; Bertrand Vrignon; Mikaël Deobarro; Thanh Vinh Dinh (IEEE Trans. Instrum. Meas., 2012)

Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission. - Alexandre Boyer; Sonia Ben Dhia (EMC Compo, 2013)

Electro-magnetic robustness of integrated circuits: from statement to prediction. - Sonia Ben Dhia; Alexandre Boyer (EMC Compo, 2013)

Effect of aging on power integrity of digital integrated circuits. - Alexandre Boyer; Sonia Ben Dhia (LATW, 2013)

Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project. - Sonia Ben Dhia; Alexandre Boyer (Microelectron. Reliab., 2013)

LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing. - Jianfei Wu; Alexandre Boyer; Jiancheng Li; Sonia Bendhia; Bertrand Vrignon (Microelectron. Reliab., 2013)

Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing. - Sonia Ben Dhia; Alexandre Boyer (LATW, 2014)

Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits. - Alexandre Boyer; Sonia Ben Dhia (J. Low Power Electron., 2014)

Bandgap failure study due to parasitic bipolar substrate coupling in Smart Power mixed ICs. - Veljko Tomasevic; Alexandre Boyer; Sonia Ben Dhia (EMC Compo, 2015)

Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter. - He Huang; Alexandre Boyer; Sonia Bendhia (Microelectron. Reliab., 2015)

Electronic counterfeit detection based on the measurement of electromagnetic fingerprint. - He Huang; Alexandre Boyer; Sonia Ben Dhia (Microelectron. Reliab., 2015)

Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes. - Alexandre Boyer; Nicolas Nolhier; Fabrice Caignet; Sonia Ben Dhia (IEEE Trans. Instrum. Meas., 2021)

Accelerated characterisation of Operational Amplifiers' susceptibility using multitone disturbance. - Matthieu Laidet; Alexandre Boyer; Julien Gazave; Sonia Ben Dhia (EMC Compo, 2024)