An algorithm to reduce test application time in full scan designs. - Soo Young Lee; Kewal K. Saluja (ICCAD, 1992)

Efficient Test Vectors for ISCAS Sequential Benchmark Circuits. - Soo Young Lee; Kewal K. Saluja (ISCAS, 1993)

An Efficient Algorithm for Sequential Circuit Test Generation. - Todd P. Kelsey; Kewal K. Saluja; Soo Young Lee (IEEE Trans. Computers, 1993)

Sequential test generation with reduced test clocks for partial scan designs. - Soo Young Lee; Kewal K. Saluja (VTS, 1994)

Test application time reduction for sequential circuits with scan. - Soo Young Lee; Kewal K. Saluja (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995)

Performance Improvement of Fault Tolerant CORBA Based Intelligent Transportation Systems (ITS) with an Autonomous Agent. - Woonsuk Suh; Soo Young Lee; Eunseok Lee 001 (NGITS, 2009)

Spatial and Sequential Deep Learning Approach for Predicting Temperature Distribution in a Steel-Making Continuous Casting Process. - Soo Young Lee; Bayu Adhi Tama; Changyun Choi; Jong-Yeon Hwang; Jonggeun Bang; Seungchul Lee (IEEE Access, 2020)

Vision-Based Fault Diagnostics Using Explainable Deep Learning With Class Activation Maps. - Kyung Ho Sun; Hyunsuk Huh; Bayu Adhi Tama; Soo Young Lee; Joon Ha Jung; Seungchul Lee (IEEE Access, 2020)

Deep Learning-Based Estimation of the Unknown Road Profile and State Variables for the Vehicle Suspension System. - Gyuwon Kim; Soo Young Lee; Jong-Seok Oh; Seungchul Lee (IEEE Access, 2021)

Deep Learning-Enabled High-Resolution and Fast Sound Source Localization in Spherical Microphone Array System. - Soo Young Lee; Jiho Chang; Seungchul Lee (IEEE Trans. Instrum. Meas., 2022)

A Physics-informed and data-driven deep learning approach for wave propagation and its scattering characteristics. - Soo Young Lee; Choon-Su Park; Keonhyeok Park; Hyung Jin Lee; Seungchul Lee (Eng. Comput., 2023)