AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress. - E. A. Douglas; C. Y. Chang; David J. Cheney; B. P. Gila; Chi-Fai Lo; Liu Lu; M. R. Holzworth; Patrick G. Whiting; Kevin S. Jones; Glen David Via; Jinhyung Kim; Soohwan Jang; et al. (Microelectron. Reliab., 2011)

Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors. - E. A. Douglas; C. Y. Chang; B. P. Gila; M. R. Holzworth; Kevin S. Jones; Lu Liu 011; Jinhyung Kim; Soohwan Jang; Glen David Via; Fan Ren; Stephen J. Pearton (Microelectron. Reliab., 2012)

Hydrogen Sensing Performance of ZnO Schottky Diodes in Humid Ambient Conditions with PMMA Membrane Layer. - Soohwan Jang; Sunwoo Jung; Kwang Hyeon Baik (Sensors, 2020)