Highly Reliable 28nm Embedded Flash Process Development for High-Density and High-Speed Automotive Grade-1 Application. - Jaehun Lee; Youngcheon Jeong; Kyongsik Yeom; Changmin Jeon; Jongsung Woo; Sangjin Lee; Ga-Young Lee; Dong-Hwee Hwang; Yong Seok Chung; Minji Seo; Dong-Hyun Kim; DalHwan Kim; et al. (IMW, 2021)

14nm FinFET Node Embedded MRAM Technology for Automotive Non-Volatile RAM Applications with Endurance Over 1E12-Cycles. - Joosung Oh; Jaehyeon Park; Kiseok Suh; Kangmoon Lee; Sohee Hwang; Myeongjun Bak; Honghyun Kim; Baeseong Kwon; DongKyu Lee; Minkwan Kim; Seungmo Noh; Jongmin Lee; et al. (VLSI Technology and Circuits, 2024)