Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements. - Soonyoung Cha; Chang-Chih Chen; Taizhi Liu; Linda S. Milor (VTS, 2014)

Estimation of remaining life using embedded SRAM for wearout parameter extraction. - Woongrae Kim; Chang-Chih Chen; Taizhi Liu; Soonyoung Cha; Linda Milor (IWASI, 2015)

MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array. - Woongrae Kim; Chang-Chih Chen; Soonyoung Cha; Linda Milor (VTS, 2015)

Processor-level reliability simulator for time-dependent gate dielectric breakdown. - Chang-Chih Chen; Taizhi Liu; Soonyoung Cha; Linda S. Milor (Microprocess. Microsystems, 2015)

The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system. - Soonyoung Cha; Dae Hyun Kim 003; Taizhi Liu; Linda S. Milor (Microelectron. Reliab., 2015)

AVERT: An elaborate model for simulating variable retention time in DRAMs. - Dae Hyun Kim 003; Soonyoung Cha; Linda S. Milor (Microelectron. Reliab., 2015)

Built-in self-test for bias temperature instability, hot-carrier injection, and gate oxide breakdown in embedded DRAMs. - Dae Hyun Kim 003; Soonyoung Cha; Linda S. Milor (Microelectron. Reliab., 2015)

System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown. - Taizhi Liu; Chang-Chih Chen; Soonyoung Cha; Linda Milor (Microelectron. Reliab., 2015)

Adaptive supply voltage and duty cycle controller for yield-power optimization of ICs. - Soonyoung Cha; Linda Milor (IWASI, 2017)

Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements. - Soonyoung Cha; Taizhi Liu; Linda Milor (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Frontend reliability analysis and modeling from device to integrated circuits for reliability and yield enhancement system. - Soonyoung Cha (2018)