Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. - Jennifer Dworak; Michael R. Grimaila; Sooryong Lee; Li-C. Wang; M. Ray Mercer (ITC, 1999)

REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. - Michael R. Grimaila; Sooryong Lee; Jennifer Dworak; Kenneth M. Butler; Bret Stewart; Hari Balachandran; Bryan Houchins; Vineet Mathur; Jaehong Park; Li-C. Wang; M. Ray Mercer (VTS, 1999)

Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. - Jennifer Dworak; Michael R. Grimaila; Sooryong Lee; Li-C. Wang; M. Ray Mercer (ITC, 2000)

Defect-Oriented Testing and Defective-Part-Level Prediction. - Jennifer Dworak; Jason D. Wicker; Sooryong Lee; Michael R. Grimaila; M. Ray Mercer; Kenneth M. Butler; Bret Stewart; Li-C. Wang (IEEE Des. Test Comput., 2001)

A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults. - Sooryong Lee; Brad Cobb; Jennifer Dworak; Michael R. Grimaila; M. Ray Mercer (DATE, 2002)

Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults. - Jennifer Dworak; James Wingfield; Brad Cobb; Sooryong Lee; Li-C. Wang; M. Ray Mercer (DFT, 2002)