Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes. - Alain Bravaix; M. Saliva; Florian Cacho; X. Federspiel; Cheikh Ndiaye; Souhir Mhira; Edith Kussener; E. Pauly; Vincent Huard (IOLTS, 2016)

Activity profiling: Review of different solutions to develop reliable and performant design. - Florian Cacho; Ahmed Benhassain; Souhir Mhira; Ajith Sivadasan; Vincent Huard; P. Cathelin; Vincent Knopik; Abhishek Jain 003; C. R. Parthasarathy; Lorena Anghel (IOLTS, 2016)

In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability. - Ahmed Benhassain; Souhir Mhira; Florian Cacho; Vincent Huard; Lorena Anghel (IVSW, 2016)

Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. - Alain Bravaix; Florian Cacho; X. Federspiel; Cheikh Ndiaye; Souhir Mhira; Vincent Huard (Microelectron. Reliab., 2016)

Workload dependent reliability timing analysis flow. - Ajith Sivadasan; Armelle Notin; Vincent Huard; Etienne Maurin; Souhir Mhira; Florian Cacho; Lorena Anghel (DATE, 2017)

Investigation of critical path selection for in-situ monitors insertion. - Florian Cacho; Ahmed Benhassain; Riddhi Jitendrakumar Shah; Souhir Mhira; Vincent Huard; Lorena Anghel (IOLTS, 2017)

Dynamic aging compensation and Safety measures in Automotive environment. - Souhir Mhira; Vincent Huard; Ahmed Benhassain; Florian Cacho; Sylvie Naudet; Abhishek Jain 003; C. R. Parthasarathy; Alain Bravaix (IOLTS, 2017)

Cognitive approach to support dynamic aging compensation. - Souhir Mhira; Vincent Huard; Ahmed Benhassain; Florian Cacho; David Meyer; Sylvie Naudet; Abhishek Jain 003; C. R. Parthasarathy; Alain Bravaix (ITC, 2017)

Enabling robust automotive electronic components in advanced CMOS nodes. - Vincent Huard; Souhir Mhira; Florian Cacho; Alain Bravaix (Microelectron. Reliab., 2017)

Managing electrical reliability in consumer systems for improved energy efficiency. - Vincent Huard; Souhir Mhira; A. Barclais; X. Lecocq; F. Raugi; M. Cantournet; Alain Bravaix (IRPS, 2018)

Key parameters driving transistor degradation in advanced strained SiGe channels. - Vincent Huard; Cheikh Ndiaye; M. Arabi; Narendra Parihar; X. Federspiel; Souhir Mhira; S. Mahapatra; Alain Bravaix (IRPS, 2018)

Resilient automotive products through process, temperature and aging compensation schemes. - Souhir Mhira; Vincent Huard; D. Arora; Philippe Flatresse; Alain Bravaix (IRPS, 2018)

Investigation of speed sensors accuracy for process and aging compensation. - Riddhi Jitendrakumar Shah; Florian Cacho; Vincent Huard; Souhir Mhira; D. Arora; Pankaj Agarwal; Shubham Kumar; S. Balaraman; Bijoy Kumar Singh; Lorena Anghel (IRPS, 2018)

Runtime Test Solution for Adaptive Aging Compensation and Fail Operational Safety mode. - Vincent Huard; Francois Jacquet; Souhir Mhira; Lionel Jure; Olivier Montfort; Mathieu Louvat; L. Zaia; F. Bertrand; E. Acacia; O. Caffin; H. Belhadj; O. Durand; et al. (IRPS, 2022)

Correlation Technologies for OTA Testing of mmWave Mobile Devices Using Energy Metrics. - Sidina Wane; T. V. Dinh; Q. H. Tran; Damienne Bajon; F. Ferrero; Lionel Duvillaret; Gwenaël Gaborit; Jacques Sombrin; E. de Lédinghen; P. Laban; Vincent Huard; Souhir Mhira; et al. (RWS, 2022)