A latch-up-like new failure mechanism for high-density CMOS dynamic RAMs. - Tohru Furuyama; Hidemi Ishiuchi; Hiroyasu Tanaka; Yoshihisa Watanabe; Yusuke Kohyama; Tohru Kimura; Kazuyoshi Muraoka; Souichi Sugiura; Kenji Natori (IEEE J. Solid State Circuits, 1990)