Visualization in linear programming using parallel coordinates. - Abhijit Chatterjee; Partha Pratim Das; Soumendu Bhattacharya (Pattern Recognit., 1993)

Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models. - Soumendu Bhattacharya; Abhijit Chatterjee (DELTA, 2002)

Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. - Achintya Halder; Soumendu Bhattacharya; Abhijit Chatterjee (ITC, 2003)

High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. - Soumendu Bhattacharya; Abhijit Chatterjee (VTS, 2003)

A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. - Soumendu Bhattacharya; Abhijit Chatterjee (Asian Test Symposium, 2004)

Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. - Ganesh Srinivasan; Soumendu Bhattacharya; Sasikumar Cherubal; Abhijit Chatterjee (DATE, 2004)

Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. - Soumendu Bhattacharya; Ganesh Srinivasan; Sasikumar Cherubal; Abhijit Chatterjee (DELTA, 2004)

Use of Embedded Sensors for Built-In-Test of RF Circuits. - Soumendu Bhattacharya; Abhijit Chatterjee (ITC, 2004)

System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. - Soumendu Bhattacharya; Ganesh Srinivasan; Sasikumar Cherubal; Achintya Halder; Abhijit Chatterjee (VTS, 2004)

On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). - Donghoon Han; Selim Sermet Akbay; Soumendu Bhattacharya; Abhijit Chatterjee; William R. Eisenstadt (IOLTS, 2005)

Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF. - Soumendu Bhattacharya; Rajarajan Senguttuvan; Abhijit Chatterjee (ITC, 2005)

A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. - Achintya Halder; Soumendu Bhattacharya; Ganesh Srinivasan; Abhijit Chatterjee (VLSI Design, 2005)

Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. - Soumendu Bhattacharya; Abhijit Chatterjee (VTS, 2005)

Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. - Soumendu Bhattacharya; Achintya Halder; Ganesh Srinivasan; Abhijit Chatterjee (J. Electron. Test., 2005)

Optimized wafer-probe and assembled package test design for analog circuits. - Soumendu Bhattacharya; Abhijit Chatterjee (ACM Trans. Design Autom. Electr. Syst., 2005)

Alternate Testing of Analog and RF Systems using Extracted Test Response Features. - Soumendu Bhattacharya (2005)

Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. - Maryam Ashouei; Soumendu Bhattacharya; Abhijit Chatterjee (ETS, 2006)

Low Cost Parametric Failure Diagnosis of RF Transceivers. - Donghoon Han; Shalabh Goyal; Soumendu Bhattacharya; Abhijit Chatterjee (ETS, 2006)

Probabilistic Error Correction in Linear Digital Filters Using Checksum Codes. - Maryam Ashouei; Soumendu Bhattacharya; Abhijit Chatterjee (LATW, 2006)

Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. - Soumendu Bhattacharya; Vishwanath Natarajan; Abhijit Chatterjee; Sankar Nair (VLSI Design, 2006)

Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. - Maryam Ashouei; Soumendu Bhattacharya; Abhijit Chatterjee (VTS, 2006)

Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. - Vishwanath Natarajan; Soumendu Bhattacharya; Abhijit Chatterjee (VTS, 2006)

A DFT Approach for Testing Embedded Systems Using DC Sensors. - Soumendu Bhattacharya; Abhijit Chatterjee (IEEE Des. Test Comput., 2006)

An Accurate DNA Sensing and Diagnosis Methodology Using Fabricated Silicon Nanopores. - Soumendu Bhattacharya; Sankar Nair; Abhijit Chatterjee (IEEE Trans. Circuits Syst. I Regul. Pap., 2006)

Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors. - Maryam Ashouei; Soumendu Bhattacharya; Abhijit Chatterjee (VTS, 2007)

Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection. - Donghoon Han; Soumendu Bhattacharya; Abhijit Chatterjee (IET Comput. Digit. Tech., 2007)

Signature Testing of Analog and RF Circuits: Algorithms and Methodology. - Ramakrishna Voorakaranam; Selim Sermet Akbay; Soumendu Bhattacharya; Sasikumar Cherubal; Abhijit Chatterjee (IEEE Trans. Circuits Syst. I Regul. Pap., 2007)

Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. - Rajarajan Senguttuvan; Soumendu Bhattacharya; Abhijit Chatterjee (VTS, 2008)

System-Level Specification Testing Of Wireless Transceivers. - Achintya Halder; Soumendu Bhattacharya; Abhijit Chatterjee (IEEE Trans. Very Large Scale Integr. Syst., 2008)

Iterative built-in testing and tuning of mixed-signal/RF systems. - Abhijit Chatterjee; Donghoon Han; Vishwanath Natarajan; Shyam Kumar Devarakond; Shreyas Sen; Hyun Woo Choi; Rajarajan Senguttuvan; Soumendu Bhattacharya; Abhilash Goyal; Deuk Lee; Madhavan Swaminathan (ICCD, 2009)

Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers. - Rajarajan Senguttuvan; Soumendu Bhattacharya; Abhijit Chatterjee (IEEE Trans. Very Large Scale Integr. Syst., 2009)

Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures. - Shyam Kumar Devarakond; Shreyas Sen; Soumendu Bhattacharya; Abhijit Chatterjee (VTS, 2010)

Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation. - Aritra Banerjee; Vishwanath Natarajan; Shreyas Sen; Abhijit Chatterjee; Ganesh Srinivasan; Soumendu Bhattacharya (VLSI Design, 2011)

Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures. - Shyam Kumar Devarakond; Shreyas Sen; Soumendu Bhattacharya; Abhijit Chatterjee (IEEE Des. Test Comput., 2012)

Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. - Vishwanath Natarajan; Hyun Woo Choi; Aritra Banerjee; Shreyas Sen; Abhijit Chatterjee; Ganesh Srinivasan; Friedrich Taenzler; Soumendu Bhattacharya (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Predicting die-level process variations from wafer test data for analog devices: A feasibility study. - Shyam Kumar Devarakond; Jennifer McCoy; Amit Nahar; John M. Carulli Jr.; Soumendu Bhattacharya; Abhijit Chatterjee (LATW, 2013)