Analyzing I/O Request Characteristics of a Mobile Messenger and Benchmark Framework for Serviceable Cold Storage. - Jaemyoun Lee; Chang Song; Chanyoung Park 004; Soyeun Kim; Kyungtae Kang (IEEE Access, 2017)

In-situ and Non-contact Etch Depth Prediction in Plasma Etching via Machine Learning (ANN & BNN) and Digital Image Colorimetry. - Minji Kang; Seongho Kim; Eunseo Go; Donghyeon Paek; Geon Lim; Muyoung Kim; Soyeun Kim; Sung Kyu Jang; Min Sup Choi; Woo Seok Kang; Jaehyun Kim; Jaekwang Kim; et al. (CoRR, 2025)