Accelerated testing for time dependent dielectric breakdown (TDDB) evaluation of embedded DRAM capacitors using tantalum pentoxide. - Anand Inani; Victor Koldyaev; Spencer Graves (Microelectron. Reliab., 2007)

Accelerated testing of on-board diagnostics. - Spencer Graves; Søren Bisgaard; Murat Kulahci; John Van Gilder; John James; Ken Marko; Hal Zatorski; Tom Ting; Cuiping Wu (Qual. Reliab. Eng. Int., 2007)

sos: Searching Help Pages of R Packages. - Spencer Graves; Sundar Dorai-Raj; Romain François (R J., 2009)

Navigating the R Package Universe. - Julia Silge; John C. Nash; Spencer Graves (R J., 2018)