Linear Programming Formulations for Thermal-Aware Test Scheduling of 3D-Stacked Integrated Circuits. - Spencer K. Millican; Kewal K. Saluja (Asian Test Symposium, 2012)

Formulating Optimal Test Scheduling Problem with Dynamic Voltage and Frequency Scaling. - Spencer K. Millican; Kewal K. Saluja (Asian Test Symposium, 2013)

CryptIP: An Approach for Encrypting Intellectual Property Cores with Simulation Capabilities. - Spencer K. Millican; Parameswaran Ramanathan; Kewal K. Saluja (VLSID, 2014)

A Test Partitioning Technique for Scheduling Tests for Thermally Constrained 3D Integrated Circuits. - Spencer K. Millican; Kewal K. Saluja (VLSID, 2014)

Optimal Test Scheduling Formulation under Power Constraints with Dynamic Voltage and Frequency Scaling. - Spencer K. Millican; Kewal K. Saluja (J. Electron. Test., 2014)

Optimal Test Scheduling of Stacked Circuits under Various Hardware and Power Constraints. - Spencer K. Millican; Kewal K. Saluja (VLSID, 2015)

Applying Neural Networks to Delay Fault Testing: Test Point Insertion and Random Circuit Training. - Spencer K. Millican; Yang Sun; Soham Roy; Vishwani D. Agrawal (ATS, 2019)

Test Point Insertion Using Artificial Neural Networks. - Yang Sun; Spencer K. Millican (ISVLSI, 2019)

Techniques for Debug of Low Power SoCs. - Sankaran M. Menon; Ashish Gupta; Chinna Prudvi; Rolf Kühnis; Sukhbinder Singh Takhar; Spencer K. Millican; Eric Rentschler; Pandy Kalimuthu; Preeti Ranjan Panda; Priyadarsan Patra (MTV, 2019)

Improved Random Pattern Delay Fault Coverage Using Inversion Test Points. - Soham Roy; Brandon Stiene; Spencer K. Millican; Vishwani D. Agrawal (NATW, 2019)

Special Session: Delay Fault Testing - Present and Future. - Jubayer Mahmod; Spencer K. Millican; Ujjwal Guin; Vishwani D. Agrawal (VTS, 2019)

A Quaternary FPGA Architecture Using Floating Gate Memories. - Ayokunle Fadamiro; Pouyan Rezaie; Christopher Harris; Spencer K. Millican (FCCM, 2020)

Machine Intelligence for Efficient Test Pattern Generation. - Soham Roy; Spencer K. Millican; Vishwani D. Agrawal (ITC, 2020)

Calculating Signal Controllability using Neural Networks: Improvements to Testability Analysis and Test Point Insertion. - Joshua Immanuel; Spencer K. Millican (NATW, 2020)

Special Session: Survey of Test Point Insertion for Logic Built-in Self-test. - Yang Sun; Spencer K. Millican; Vishwani D. Agrawal (VTS, 2020)

Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures. - Soham Roy; Brandon Stiene; Spencer K. Millican; Vishwani D. Agrawal (J. Electron. Test., 2020)

A study of transistor degradation in cyber-physical system control devices: work-in-progress. - Spencer K. Millican; SueAnne Griffith (CODES+ISSS, 2021)

Unsupervised Learning in Test Generation for Digital Integrated Circuits. - Soham Roy; Spencer K. Millican; Vishwani D. Agrawal (ETS, 2021)

Simulating and Evaluating a Quaternary Logic FPGA Based on Floating-gate Memories and Voltage Division. - Ayokunle Fadamiro; Pouyan Rezaie; Spencer K. Millican; Christopher Harris (FPGA, 2021)

A Pragmatic Quaternary FPGA Implemented with Floating Gate Memories. - Ayokunle Fadamiro; Pouyan Rezaie; Spencer K. Millican; Christoper B. Harris (ISMVL, 2021)

Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator. - Soham Roy; Spencer K. Millican; Vishwani D. Agrawal (VLSID, 2021)

Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits. - Soham Roy; Spencer K. Millican; Vishwani D. Agrawal (VTS, 2021)

Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point Insertion. - Yang Sun; Spencer K. Millican (J. Electron. Test., 2022)

A Survey and Recent Advances: Machine Intelligence in Electronic Testing. - Soham Roy; Spencer K. Millican; Vishwani D. Agrawal (J. Electron. Test., 2024)