Circuit reliability: From Physics to Architectures: Embedded tutorial paper. - Jianxin Fang; Saket Gupta; Sanjay V. Kumar; Sravan K. Marella; Vivek Mishra; Pingqiang Zhou; Sachin S. Sapatnekar (ICCAD, 2012)

A holistic analysis of circuit timing variations in 3D-ICs with thermal and TSV-induced stress considerations. - Sravan K. Marella; Sanjay V. Kumar; Sachin S. Sapatnekar (ICCAD, 2012)

The impact of shallow trench isolation effects on circuit performance. - Sravan K. Marella; Sachin S. Sapatnekar (ICCAD, 2013)

Optimization of FinFET-based circuits using a dual gate pitch technique. - Sravan K. Marella; Amit Ranjan Trivedi; Saibal Mukhopadhyay; Sachin S. Sapatnekar (ICCAD, 2015)

A Holistic Analysis of Circuit Performance Variations in 3-D ICs With Thermal and TSV-Induced Stress Considerations. - Sravan K. Marella; Sachin S. Sapatnekar (IEEE Trans. Very Large Scale Integr. Syst., 2015)

Incorporating the Role of Stress on Electromigration in Power Grids with Via Arrays. - Vivek Mishra; Palkesh Jain; Sravan K. Marella; Sachin S. Sapatnekar (DAC, 2017)

Circuit Performance Shifts Due to Layout-Dependent Stress in Planar and 3D-ICs. - Sravan K. Marella; Sachin S. Sapatnekar (IEEE Trans. Very Large Scale Integr. Syst., 2018)