Built in Defect Prognosis for Embedded Memories. - Prashant Dubey; Akhil Garg 001; Sravan Kumar Bhaskarani (DDECS, 2007)

GALS Based Shared Test Architecture for Embedded Memories. - Prashant Dubey; Akhil Garg 001; Sravan Kumar Bhaskarani (ISCAS, 2007)

Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis. - Prashant Dubey; Akhil Garg 001; Sravan Kumar Bhaskarani (ISVLSI, 2007)