Aging of the over-voltage protection elements caused by over-voltages. - Predrag Osmokrovic; Boris Loncar; Srboljub Stankovic; Aleksandra Vasic (Microelectron. Reliab., 2002)

The new method of determining characteristics of elements for overvoltage protection of low-voltage system. - Predrag Osmokrovic; Boris Loncar; Srboljub Stankovic (IEEE Trans. Instrum. Meas., 2006)

NBTI and irradiation related degradation mechanisms in power VDMOS transistors. - Ninoslav Stojadinovic; Snezana Djoric-Veljkovic; Vojkan Davidovic; Snezana Golubovic; Srboljub Stankovic; Aneta Prijic; Zoran Prijic; Ivica Manic; Danijel Dankovic (Microelectron. Reliab., 2018)

Floating-Gate MOS Transistor with Dynamic Biasing as a Radiation Sensor. - Stefan D. Ilic; Aleksandar Jevtic; Srboljub Stankovic; Goran S. Ristic (Sensors, 2020)

Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress. - Sandra Veljkovic; Nikola Mitrovic; Vojkan Davidovic; Snezana Golubovic; Snezana Djoric-Veljkovic; Albena Paskaleva; Dencho Spassov; Srboljub Stankovic; Marko S. Andjelkovic; Zoran Prijic; Ivica Manic; Aneta Prijic; et al. (J. Circuits Syst. Comput., 2022)