Improving test compression by retaining non-pivot free variables in sequential linear decompressors. - Sreenivaas S. Muthyala; Nur A. Touba (ITC, 2012)

SOC test compression scheme using sequential linear decompressors with retained free variables. - Sreenivaas S. Muthyala; Nur A. Touba (VTS, 2013)

Improving test compression with scan feedforward techniques. - Sreenivaas S. Muthyala; Nur A. Touba (ITC, 2014)

Reducing test time for 3D-ICs by improved utilization of test elevators. - Sreenivaas S. Muthyala; Nur A. Touba (VLSI-SoC, 2014)

Efficient Utilization of Test Elevators to Reduce Test Time in 3D-ICs. - Sreenivaas S. Muthyala; Nur A. Touba (VLSI-SoC (Selected Papers), 2014)

Compacting output responses containing unknowns using an embedded processor. - Kamran Saleem; Sreenivaas S. Muthyala; Nur A. Touba (DFTS, 2015)