Expediting ramp-to-volume production. - Hari Balachandran; Jason Parker; Gordon Gammie; John W. Olson; Craig Force; Kenneth M. Butler; Sri Jandhyala (ITC, 1999)

Clustering based techniques for I_DDQ testing. - Sri Jandhyala; Hari Balachandran; Anura P. Jayasumana (ITC, 1999)

Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. - Sri Jandhyala; Hari Balachandran; Manidip Sengupta; Anura P. Jayasumana (VTS, 2000)

Antirandom Testing: A Distance-Based Approach. - Shen Hui Wu; Sridhar Jandhyala; Yashwant K. Malaiya; Anura P. Jayasumana (VLSI Design, 2008)