An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. - Srikanth Venkataraman; Srihari Sivaraj; M. Enamul Amyeen; Sangbong Lee; Ajay Ojha; Ruifeng Guo (VTS, 2004)

Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. - Ruifeng Guo; Subhasish Mitra; M. Enamul Amyeen; Jinkyu Lee; Srihari Sivaraj; Srikanth Venkataraman (VTS, 2006)