Reliability modeling of metal interconnects with time-dependent electrical and thermal stress. - Srijita Patra; Degang Chen 001; Randy Geiger (MWSCAS, 2012)

Reliability degradation with electrical, thermal and thermal gradient stress in interconnects. - Srijita Patra; Degang Chen 001; Randy Geiger (ISCAS, 2013)

Comparison of MOSFET mismatch models with random physical and random model variables. - Srijita Patra; Randall L. Geiger (MWSCAS, 2014)