Enhancements in Deterministic BIST Implementations for Improving Test of Complex SOCs. - Sandeep Jain; Jais Abraham; Srinivas Kumar Vooka; Sumant Kale; Amit Dutta; Rubin A. Parekhji (VLSI Design, 2007)

Power Analysis and Reduction Techniques for Transition Fault Testing. - Khushboo Agarwal; Srinivas Vooka; Srivaths Ravi 001; Rubin A. Parekhji; Arjun Singh Gill (ATS, 2008)

Techniques to improve memory interface test quality for complex SoCs. - V. R. Devanathan; Srinivas Kumar Vooka (ITC, 2011)

At-speed Testing of Asynchronous Reset De-assertion Faults. - Arvind Jain; Maheedhar Jalasutram; Srinivas Vooka; Prasun Nair; Neeraj Pradhan (VLSI Design, 2012)

A Silicon Testing Strategy for Pulse-Width Failures. - Srinivas Vooka; Khushboo Agarwal; Abhijeet Shrivastava; Pranav Murthy; Ramakrishnan Venkatraman (VLSI Design, 2012)