Built-In Self-Test for System-on-Chip: A Case Study. - Charles E. Stroud; John Sunwoo; Srinivas M. Garimella; Jonathan Harris (ITC, 2004)

On-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in System-on-Chip Devices. - Charles E. Stroud; Srinivas M. Garimella; John Sunwoo (CATA, 2005)

Built-In Self-Test and Diagnosis of Multiple Embedded Cores in SoCs. - Srinivas M. Garimella; Charles E. Stroud (ESA, 2005)