Laser Polarimetric Imaging of Surface Defects of Semiconductor Wafers, Microelectronics, and Spacecraft Structures. - George C. Giakos; A. Medithe; S. Sumrain; Srinivas Sukumar; Luay Fraiwan; A. Orozco (IEEE Trans. Instrum. Meas., 2006)

Increased Visibility of Targets Submerged in Scattering Opaque Media and Polarimetric Techniques. - George C. Giakos; Srinivas Sukumar; Keerthisrivatsav Valluru; P. Bathini; S. Atreya Paturi; K. Ambadipudi; D. Wagenar; V. Adya; M. Reddy; Luay Fraiwan; Daniel B. Sheffer (IEEE Trans. Instrum. Meas., 2008)

Efficient Molecular Imaging Techniques Using Optically Active Molecules. - George C. Giakos; S. Atreya Paturi; Keerthisrivatsav Valluru; P. Bathini; V. Adya; Srinivas Sukumar; K. Ambadipudi; B. Mandadi; M. Becker; S. Athawale; P. Farajipour; S. Marotta; et al. (IEEE Trans. Instrum. Meas., 2010)