Thin-film SOI PIN-diode leakage current dependence on back-gate-potential and HCI traps. - Andrei Schmidt; Stefan Dreiner; Holger Vogt; Uwe Paschen (ESSDERC, 2015)

High temperature SOI CMOS technology and circuit realization for applications up to 300°C. - Holger Kappert; Norbert Kordas; Stefan Dreiner; Uwe Paschen; Rainer Kokozinski (ISCAS, 2015)

Evaluation of a median threshold based EEPROM-PUF concept implemented in a high temperature SOI CMOS technology. - Benjamin Willsch; Marius te Heesen; Julia Hauser; Stefan Dreiner; Holger Kappert; Holger Vogt (DTIS, 2018)

Post-CMOS 3D-Integration of a Nanopellistor. - Finja M. Münchenberger; Stefan Dreiner; Holger Kappert; Holger Vogt (PRIME, 2019)