An Effective Diagnosis Method to Support Yield Improvement. - Camelia Hora; Rene Segers; Stefan Eichenberger; Maurice Lousberg (ITC, 2002)

Design for Manufacturability - or the meaning of 'subtle'. - Stefan Eichenberger (ITC, 2003)

Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. - Ananta K. Majhi; Guido Gronthoud; Camelia Hora; Maurice Lousberg; Pop Valer; Stefan Eichenberger (VTS, 2003)

On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. - Camelia Hora; Rene Segers; Stefan Eichenberger; Maurice Lousberg (J. Electron. Test., 2003)

On Hazard-free Patterns for Fine-delay Fault Testing. - Bram Kruseman; Ananta K. Majhi; Guido Gronthoud; Stefan Eichenberger (ITC, 2004)

Systematic Defects in Deep Sub-Micron Technologies. - Bram Kruseman; Ananta K. Majhi; Camelia Hora; Stefan Eichenberger; Johan Meirlevede (ITC, 2004)

Delay Defect Screening using Process Monitor Structures. - Subhasish Mitra; Erik H. Volkerink; Edward J. McCluskey; Stefan Eichenberger (VTS, 2004)

ITC 2003 Roundtable: Design for Manufacturability. - Rob Aitken; Stefan Eichenberger; Gary Maier; Sandip Kundu; Hank Walker (IEEE Des. Test Comput., 2004)

Memory Testing Under Different Stress Conditions: An Industrial Evaluation. - Ananta K. Majhi; Mohamed Azimane; Guido Gronthoud; Maurice Lousberg; Stefan Eichenberger; Fred Bowen (DATE, 2005)

Memory testing improvements through different stress conditions. - Ananta K. Majhi; Mohamed Azimane; Guido Gronthoud; Maurice Lousberg; Stefan Eichenberger; Fred Bowen (ESSCIRC, 2005)

Power Supply Noise in Delay Testing. - Jing Wang 006; D. M. H. Walker; Ananta K. Majhi; Bram Kruseman; Guido Gronthoud; Luis Elvira Villagra; Paul van de Wiel; Stefan Eichenberger (ITC, 2006)

Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman; Maurice Lousberg; Ananta K. Majhi (VTS, 2007)

Diagnosis of Full Open Defects in Interconnecting Lines. - Rosa Rodríguez-Montañés; Daniel Arumí; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman; Maurice Lousberg; Ananta K. Majhi (VTS, 2007)

Modeling Power Supply Noise in Delay Testing. - Jing Wang 006; Duncan M. Hank Walker; Xiang Lu; Ananta K. Majhi; Bram Kruseman; Guido Gronthoud; Luis Elvira Villagra; Paul J. A. M. van de Wiel; Stefan Eichenberger (IEEE Des. Test Comput., 2007)

Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. - Stefan Eichenberger; Jeroen Geuzebroek; Camelia Hora; Bram Kruseman; Ananta K. Majhi (ITC, 2008)

Time-dependent Behaviour of Full Open Defects in Interconnect Lines. - Rosa Rodríguez-Montañés; Daniel Arumí; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (ITC, 2008)

Full Open Defects in Nanometric CMOS. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (VTS, 2008)

Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. - Friedrich Hapke; Rene Krenz-Baath; Andreas Glowatz; Jürgen Schlöffel; Hamidreza Hashempour; Stefan Eichenberger; Camelia Hora; Dan Adolfsson (ITC, 2009)

Diagnosis of full open defects in interconnect lines with fan-out. - Rosa Rodríguez-Montañés; Daniel Arumí; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (ETS, 2010)

Defect-oriented cell-internal testing. - Friedrich Hapke; Wilfried Redemund; Jürgen Schlöffel; Rene Krenz-Baath; Andreas Glowatz; Michael Wittke; Hamidreza Hashempour; Stefan Eichenberger (ITC, 2010)

Impact of Temperature on Test Quality. - Lavanya Jagan; Camelia Hora; Bram Kruseman; Stefan Eichenberger; Ananta K. Majhi; V. Kamakoti 001 (VLSI Design, 2010)

Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011)

Gate Leakage Impact on Full Open Defects in Interconnect Lines. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (IEEE Trans. Very Large Scale Integr. Syst., 2011)

Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)