Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. - Stefan Hillebrecht; Ilia Polian; Piet Engelke; Bernd Becker 001; Martin Keim; Wu-Tung Cheng (ITC, 2008)

SAT-based analysis of sensitisable paths. - Matthias Sauer 002; Alexander Czutro; Tobias Schubert 001; Stefan Hillebrecht; Ilia Polian; Bernd Becker 001 (DDECS, 2011)

Exact stuck-at fault classification in presence of unknowns. - Stefan Hillebrecht; Michael A. Kochte; Hans-Joachim Wunderlich; Bernd Becker 001 (ETS, 2012)

Accurate QBF-based test pattern generation in presence of unknown values. - Stefan Hillebrecht; Michael A. Kochte; Dominik Erb; Hans-Joachim Wunderlich; Bernd Becker 001 (DATE, 2013)

SAT-Based Analysis of Sensitizable Paths. - Matthias Sauer 002; Alexander Czutro; Tobias Schubert 001; Stefan Hillebrecht; Ilia Polian; Bernd Becker 001 (IEEE Des. Test, 2013)

Exact Logic and Fault Simulation in Presence of Unknowns. - Dominik Erb; Michael A. Kochte; Matthias Sauer 002; Stefan Hillebrecht; Tobias Schubert 001; Hans-Joachim Wunderlich; Bernd Becker 001 (ACM Trans. Design Autom. Electr. Syst., 2014)