Simulating Open-Via Defects. - Stefan Spinner; Jie Jiang 018; Ilia Polian; Piet Engelke; Bernd Becker 001 (ATS, 2007)

Electromechanical Reliability Testing of Three-Axial Silicon Force Sensors - Stefan Spinner; Julian Bartholomeyczik; Bernd Becker 001; Michael Doelle; Oliver Paul; Ilia Polian; Roland Roth; Karl Seitz; Patrick Ruther (CoRR, 2007)

Diagnosis of Realistic Defects Based on the X-Fault Model. - Ilia Polian; Kohei Miyase; Yusuke Nakamura; Seiji Kajihara; Piet Engelke; Bernd Becker 001; Stefan Spinner; Xiaoqing Wen (DDECS, 2008)

Automatic Test Pattern Generation for Interconnect Open Defects. - Stefan Spinner; Ilia Polian; Piet Engelke; Bernd Becker 001; Martin Keim; Wu-Tung Cheng (VTS, 2008)