High-resolution SILC measurements of thin SiO2 at ultra low voltages. - Stefano Aresu; Ward De Ceuninck; R. Dreesen; Kris Croes; E. Andries; Jean Manca; Luc De Schepper; Robin Degraeve; Ben Kaczer; Marc D'Olieslaeger (Microelectron. Reliab., 2002)

A new method for the analysis of high-resolution SILC data. - Stefano Aresu; Ward De Ceuninck; G. Knuyt; J. Mertens; Jean Manca; Luc De Schepper; Robin Degraeve; Ben Kaczer; Marc D'Olieslaeger; Jan D'Haen (Microelectron. Reliab., 2003)

Evidence for source side injection hot carrier effects on lateral DMOS transistors. - Stefano Aresu; Ward De Ceuninck; Geert Van den Bosch; Guido Groeseneken; Peter Moens; Jean Manca; D. Wojciechowski; P. Gassot (Microelectron. Reliab., 2004)

Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors. - Stefano Aresu; Werner Kanert; Reinhard Pufall; Michael Goroll (Microelectron. Reliab., 2007)

Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices. - Michael Goroll; Werner Kanert; Reinhard Pufall; Stefano Aresu (Microelectron. Reliab., 2007)

NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique. - Stefano Aresu; Reinhard Pufall; Michael Goroll; Wolfgang Gustin (Microelectron. Reliab., 2008)

New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure. - Michael Goroll; Reinhard Pufall; Stefano Aresu; Wolfgang Gustin (Microelectron. Reliab., 2008)

Reduction of test effort. Looking for more acceleration for reliable components for automotive applications. - Reinhard Pufall; Werner Kanert; Stefano Aresu; Michael Goroll (Microelectron. Reliab., 2008)

New insights on the PBTI phenomena in SiON pMOSFETs. - Karina Rott; Hans Reisinger; Stefano Aresu; Christian Schlünder; Klaus Kölpin; Wolfgang Gustin; Tibor Grasser (Microelectron. Reliab., 2012)

HCS degradation of 5 nm oxide high-voltage PLDMOS. - C. Olk; Stefano Aresu; R. Rudolf; M. Röhner; Wolfgang Gustin; E. Stein Von Kamienski (Microelectron. Reliab., 2014)

28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers. - Alessandro Grossi; Matteo Coppetta; Stefano Aresu; Andreas Kux; Thomas Kern; Robert Strenz (IMW, 2023)