Voltage oscillations during surge pulses induced by self-extinguishing non-destructive second breakdown in pn-junction diodes. - Steffen Holland; Rolf Brenner (Microelectron. Reliab., 2018)

Investigations on current filamentation in PIN diodes using TLP measurements and TCAD simulations. - Patrick Scharf; Christoph Sohrmann; Steffen Holland; Volkhard Beyer (ESSDERC, 2019)