Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers. - Sybille Hellebrand; Steffen Tarnick; Bernard Courtois; Janusz Rajski (ITC, 1992)

Pattern generation for a deterministic BIST scheme. - Sybille Hellebrand; Birgit Reeb; Steffen Tarnick; Hans-Joachim Wunderlich (ICCAD, 1995)

Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. - Sybille Hellebrand; Janusz Rajski; Steffen Tarnick; Srikanth Venkataraman; Bernard Courtois (IEEE Trans. Computers, 1995)

Controllable self-checking checkers for conditional concurrent checking. - Steffen Tarnick (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995)

Data compression techniques for concurrent error detection and built-in self test. - Steffen Tarnick (1995)

Self-Checking Comparator with One Periodic Output. - Sandip Kundu; Egor S. Sogomonyan; Michael Gössel; Steffen Tarnick (IEEE Trans. Computers, 1996)

Embedded self-testing checkers for low-cost arithmetic codes. - Steffen Tarnick; Albrecht P. Stroele (ITC, 1998)

Embedded Parity and Two-Rail TSC Checkers with Error-Memorizing Capability. - Steffen Tarnick (VLSI Design, 1998)

Programmable Embedded Self-Testing Checkers for All-Unidirectional Error-Detecting Code. - Albrecht P. Stroele; Steffen Tarnick (VTS, 1999)

Embedded Checker Architectures for Cyclic and Low-Cost Arithmetic Codes. - Albrecht P. Stroele; Steffen Tarnick (J. Electron. Test., 2000)

Self-Testing Embedded Checkers for Bose-Lin, Bose, and a Class of Borden Codes. - Steffen Tarnick (DATE, 2003)

A Design Method for Embedded Self-Testing t-UED and BUED Code Checkers. - Steffen Tarnick (IOLTS, 2003)

Single-Output Embedded Checkers for Systematic Unordered Codes. - Steffen Tarnick (IOLTS, 2004)

Design of Embedded Self-Testing Checkers for t-UED and BUED Codes. - Steffen Tarnick (J. Electron. Test., 2004)

Single- and Double-Output Embedded Checker Architectures for Systematic Unordered Codes. - Steffen Tarnick (J. Electron. Test., 2005)

Embedded Borden 2-UED Code Checkers. - Steffen Tarnick (IOLTS, 2006)

Design of Embedded m-out-of-n Code Checkers Using Complete Parallel Counters. - Steffen Tarnick (IOLTS, 2007)

A Low-Cost Accumulator-Based Test Pattern Generation Architecture. - Dimitris Magos; Ioannis Voyiatzis; Steffen Tarnick (IOLTS, 2008)

Self-Testing Embedded Borden t -UED Code Checkers for t = 2 k q - 1 with q = 2 m - 1. - Steffen Tarnick (J. Electron. Test., 2008)

Design of embedded constant weight code checkers based on averaging operations. - Steffen Tarnick (IOLTS, 2010)

An Accumulator - Based Test-Per-Clock Scheme. - Dimitris Magos; Ioannis Voyiatzis; Steffen Tarnick (IEEE Trans. Very Large Scale Integr. Syst., 2011)