Low-cost phase noise testing of complex RF ICs using standard digital ATE. - Stephane David-Grignot; Florence Azaïs; Laurent Latorre; Francois Lefevre (ITC, 2014)

Phase noise measurement on IF analog signals using standard digital ATE resources. - Stephane David-Grignot; Florence Azaïs; Laurent Latorre; Francois Lefevre (NEWCAS, 2014)

Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals. - Florence Azaïs; Stephane David-Grignot; Laurent Latorre; Francois Lefevre (DDECS, 2015)

A new technique for low-cost phase noise production testing from 1-bit signal acquisition. - Stephane David-Grignot; Florence Azaïs; Laurent Latorre; Francois Lefevre (ETS, 2015)

A digital technique for the evaluation of SSB phase noise of analog/RF signals. - Florence Azaïs; Stephane David-Grignot; Laurent Latorre; Francois Lefevre (LATS, 2015)

Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range. - Stephane David-Grignot; Florence Azaïs; Laurent Latorre; Francois Lefevre (J. Electron. Test., 2015)

SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE. - Florence Azaïs; Stephane David-Grignot; Laurent Latorre; Francois Lefevre (J. Electron. Test., 2016)

Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits. - Florence Azaïs; Stephane David-Grignot; Laurent Latorre; Francois Lefevre (J. Circuits Syst. Comput., 2016)

Wideband Fully Differential Current Driver with Optimized Output Impedance for Bioimpedance Measurements. - Achraf Lamlih; Philippe Freitas; Stephane David-Grignot; Jérémie Salles; Vincent Kerzèrho; Fabien Soulier; Serge Bernard; Tristan Rouyer; Sylvain Bonhommeau (ISCAS, 2018)

On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints. - Stephane David-Grignot; Achraf Lamlih; Mohamed Moez Belhaj; Vincent Kerzerho; Florence Azaïs; Fabien Soulier; Philippe Freitas; Tristan Rouyer; Sylvain Bonhommeau; Serge Bernard (J. Electron. Test., 2018)