Laser diode COFD analysis by thermoreflectance microscopy. - Stefan Dilhaire; Stéphane Grauby; Sébastien Jorez; Luis David Patiño Lopez; Emmanuel Schaub; Wilfrid Claeys (Microelectron. Reliab., 2001)

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. - G. Andriamonje; Vincent Pouget; Yves Ousten; Dean Lewis; Yves Danto; Jean-Michel Rampnoux; Younès Ezzahri; Stefan Dilhaire; Stéphane Grauby; Wilfrid Claeys (Microelectron. Reliab., 2003)

Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. - Stefan Dilhaire; M. Amine Salhi; Stéphane Grauby; Wilfrid Claeys (Microelectron. Reliab., 2003)

Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. - Stefan Dilhaire; Stéphane Grauby; Wilfrid Claeys; Jean-Christophe Batsale (Microelectron. J., 2004)

Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. - Luis David Patiño Lopez; Stéphane Grauby; Stefan Dilhaire; M. Amine Salhi; Wilfrid Claeys; Stéphane Lefèvre; Sebastian Volz (Microelectron. J., 2004)

Applications of temperature phase measurements to IC testing. - Josep Altet; Jean-Michel Rampnoux; Jean-Christophe Batsale; Stefan Dilhaire; Antonio Rubio 001; Wilfrid Claeys; Stéphane Grauby (Microelectron. Reliab., 2004)

Strain energy imaging of a power MOS transistor using speckle interferometry. - Stefan Dilhaire; Stéphane Grauby; Sébastien Jorez; Wilfrid Claeys (IEEE Trans. Reliab., 2004)

ElectroStatic Discharge Fault Localization by Laser Probing. - Stéphane Grauby; M. Amine Salhi; Wilfrid Claeys; D. Trias; Stefan Dilhaire (Microelectron. Reliab., 2005)

Time gating imaging through thick silicon substrate: a new step towards backside characterisation. - Jean-Michel Rampnoux; H. Michel; M. Amine Salhi; Stéphane Grauby; Wilfrid Claeys; Stefan Dilhaire (Microelectron. Reliab., 2006)

Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. - Eduardo Aldrete-Vidrio; M. Amine Salhi; Josep Altet; Stéphane Grauby; Diego Mateo; H. Michel; L. Clerjaud; Jean-Michel Rampnoux; Antonio Rubio 001; Wilfrid Claeys; Stefan Dilhaire (ETS, 2008)

Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. - Stéphane Grauby; M. Amine Salhi; Luis David Patiño Lopez; Wilfrid Claeys; Benoît Charlot; Stefan Dilhaire (Microelectron. Reliab., 2008)

Joule expansion imaging techniques on microlectronic devices. - Stéphane Grauby; Luis David Patiño Lopez; M. Amine Salhi; Etienne Puyoo; Jean-Michel Rampnoux; Wilfrid Claeys; Stefan Dilhaire (Microelectron. J., 2009)

Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. - Josep Altet; José Luis González 001; Didac Gómez; Xavier Perpiñà; Wilfrid Claeys; Stéphane Grauby; Cédric Dufis; Miquel Vellvehí; Diego Mateo; Ferran Reverter; Stefan Dilhaire; Xavier Jordà (Microelectron. J., 2014)

Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment. - Jérémy Michaud; Guillaume Pedroza; Laurent Béchou; L. S. How; Olivier Gilard; David Veyrié; F. Laruelle; Stéphane Grauby (Microelectron. Reliab., 2015)