Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation. - Heinz Mattes; Stéphane Kirmser; Sebastian Sattler (J. Electron. Test., 2006)

Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores. - Carsten Wegener; Heinz Mattes; Stéphane Kirmser; Frank Demmerle; Sebastian Sattler (J. Electron. Test., 2009)